Munich, 28th October 2011 – Peak Solution took part in the “VIP 2011 – Virtual Instruments in Practice” congress, hosted by National Instruments on October 12 and 13 in Fürstenfeldbruck, Germany. Based on many years of experience in the field of test and measurement data management, Peak Solution presented the openMDM software platform and its application in connection with the analysis tool DIAdem.
The presentation in front of a group of high caliber experts was held by Peak Solution general manager Dr. Hans-Jörg Kremer. Dr. Kremer discussed the key performance features of openMDM and explained its interaction with the analysis tool DIAdem by presenting specific project examples and workflows. The open source software, in the development of which Peak Solution has been participating for years, has never before been presented at the National Instruments congress for users, technology and alliance partners. Therefore, the experts attending showed particular interest in the various applications of the framework to implement comprehensible cross-system processes in testing environments.
Measurement data warehouse for DIAdem
It became clear that, thanks to its modern and open source software architecture and the use of open standards, openMDM is a solution optimally suited for building up a manufacturer independent "measurement data warehouse", in which test relevant information like order data, test setups, measurement data, test results, pertaining documents or reports can be stored and managed centrally.
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